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Measurement of the bending of thin inclined nanowires as a method for determining elastic modulus

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dc.contributor.authorDunaevskiy, M. S.en
dc.contributor.authorAlekseev, P. A.en
dc.contributor.authorGeydt, P.en
dc.contributor.authorLahderanta, E.en
dc.contributor.authorHaggren, T.en
dc.contributor.authorLipsanen, H.en
dc.date.accessioned2025-12-31T18:41:35Z
dc.date.available2025-12-31T18:41:35Z
dc.date.issued2018-11-14en
dc.description.abstractThe method of measuring nanowires elastic modulus by scanning probe microscopy is presented. This method uses the measurement of nanowire bending profiles in the precise force control mode. The possibilities of the method are demonstrated by measuring the Young's modulus of thin tapered InP nanowires.en
dc.description.statusPeer-revieweden
dc.identifier.issn1757-8981en
dc.identifier.otherORCID:/0000-0001-6033-7391/work/218731352en
dc.identifier.scopus85057482928en
dc.identifier.urihttps://hdl.handle.net/1885/733797751
dc.language.isoenen
dc.relation.ispartofseriesInternational Conference on Scanning Probe Microscopy, SPM 2018en
dc.rightsPublisher Copyright: © 2018 Institute of Physics Publishing. All rights reserved.en
dc.sourceIOP Conference Series: Materials Science and Engineeringen
dc.titleMeasurement of the bending of thin inclined nanowires as a method for determining elastic modulusen
dc.typeConference paperen
dspace.entity.typePublicationen
local.contributor.affiliationDunaevskiy, M. S.; RAS - Ioffe Physico Technical Instituteen
local.contributor.affiliationAlekseev, P. A.; RAS - Ioffe Physico Technical Instituteen
local.contributor.affiliationGeydt, P.; Lappeenranta-Lahti University of Technologyen
local.contributor.affiliationLahderanta, E.; Lappeenranta-Lahti University of Technologyen
local.contributor.affiliationHaggren, T.; Aalto Universityen
local.contributor.affiliationLipsanen, H.; Aalto Universityen
local.identifier.ariespublicationa383154xPUB31711en
local.identifier.citationvolume443en
local.identifier.doi10.1088/1757-899X/443/1/012006en
local.identifier.purecf294209-ef26-4aea-8afb-9174501071c1en
local.identifier.urlhttps://www.scopus.com/pages/publications/85057482928en
local.type.statusPublisheden

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