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Measurement of the bending of thin inclined nanowires as a method for determining elastic modulus

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Date

2018-11-14

Authors

Dunaevskiy, M. S.
Alekseev, P. A.
Geydt, P.
Lahderanta, E.
Haggren, T.
Lipsanen, H.

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Abstract

The method of measuring nanowires elastic modulus by scanning probe microscopy is presented. This method uses the measurement of nanowire bending profiles in the precise force control mode. The possibilities of the method are demonstrated by measuring the Young's modulus of thin tapered InP nanowires.

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https://hdl.handle.net/1885/733797751

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ANU Research Publications

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IOP Conference Series: Materials Science and Engineering

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Conference paper

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Publication

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DOI

10.1088/1757-899X/443/1/012006

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