Cryogenic Steep Slope Field-Effect Transistors (invited talk)

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dc.contributor.authorKnoch, J.en
dc.contributor.authorRichstein, B.en
dc.contributor.authorHan, Y.en
dc.contributor.authorKonig, D.en
dc.contributor.authorFrentzen, M.en
dc.contributor.authorHellmich, L.en
dc.contributor.authorKlos, J.en
dc.contributor.authorScholz, S.en
dc.contributor.authorZhao, Q. T.en
dc.date.accessioned2025-06-12T00:36:48Z
dc.date.available2025-06-12T00:36:48Z
dc.date.issued2022en
dc.description.abstractThe present paper studies with experiment and simulation a number of measures that improve current cryogenic MOSFETs to enable the device to be operated at very low supply voltages.en
dc.description.sponsorshipFinancial support of German Research Foundation under ML4Q EXC 2004/1 – 390534769, KN-545/24 and KN-545/29, ZH-639/3 is acknowledged.en
dc.description.statusPeer-revieweden
dc.format.extent2en
dc.identifier.isbn9781665459792en
dc.identifier.otherORCID:/0000-0001-5485-9142/work/173452467en
dc.identifier.scopus85142819688en
dc.identifier.urihttp://www.scopus.com/inward/record.url?scp=85142819688&partnerID=8YFLogxKen
dc.identifier.urihttps://hdl.handle.net/1885/733759680
dc.language.isoenen
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en
dc.relation.ispartof2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022en
dc.relation.ispartofseries2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022en
dc.rightsPublisher Copyright: © 2022 IEEE.en
dc.titleCryogenic Steep Slope Field-Effect Transistors (invited talk)en
dc.typeConference paperen
dspace.entity.typePublicationen
local.contributor.affiliationKnoch, J.; RWTH Aachen Universityen
local.contributor.affiliationRichstein, B.; RWTH Aachen Universityen
local.contributor.affiliationHan, Y.; Jülich Research Centreen
local.contributor.affiliationKonig, D.; University of New South Walesen
local.contributor.affiliationFrentzen, M.; RWTH Aachen Universityen
local.contributor.affiliationHellmich, L.; RWTH Aachen Universityen
local.contributor.affiliationKlos, J.; RWTH Aachen Universityen
local.contributor.affiliationScholz, S.; RWTH Aachen Universityen
local.contributor.affiliationZhao, Q. T.; Jülich Research Centreen
local.identifier.doi10.1109/SNW56633.2022.9953898en
local.identifier.pure9bcc1994-0929-4d18-8731-ccd9fd014679en
local.identifier.urlhttps://www.scopus.com/pages/publications/85142819688en
local.type.statusPublisheden

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