Optimal and robust quantum-enhanced metrologywithout echoes

dc.contributor.authorNolan, Samuelen
dc.contributor.authorHaine, Simonen
dc.contributor.authorSzigeti, Stuarten
dc.date.accessioned2026-01-01T14:42:34Z
dc.date.available2026-01-01T14:42:34Z
dc.date.issued2017en
dc.description.abstractWe show that optimal and robust quantum metrology can be achieved without echoes. Specifically, we explore optimal measurement strategies with and without detection noise, and in both situations, find that echoes are unnecessary.en
dc.description.statusPeer-revieweden
dc.identifier.isbn9781943580262en
dc.identifier.otherORCID:/0000-0002-3015-6511/work/163626731en
dc.identifier.scopus85036457453en
dc.identifier.urihttps://hdl.handle.net/1885/733801191
dc.language.isoenen
dc.publisherOptica Publishing Groupen
dc.relation.ispartofQuantum Information and Measurement, QIM 2017en
dc.relation.ispartofseriesOptics InfoBase Conference Papersen
dc.relation.ispartofseriesQuantum Information and Measurement, QIM 2017en
dc.rightsPublisher Copyright: © OSA 2017.en
dc.titleOptimal and robust quantum-enhanced metrologywithout echoesen
dc.typeConference paperen
dspace.entity.typePublicationen
local.contributor.affiliationNolan, Samuel; University of Queenslanden
local.contributor.affiliationHaine, Simon; University of Sussexen
local.contributor.affiliationSzigeti, Stuart; School of Mathematics and Physicsen
local.identifier.doi10.1364/QIM.2017.QT6A.55en
local.identifier.essn2162-2701en
local.identifier.puref5c643b2-1631-4d08-93ae-925faa99e88cen
local.identifier.urlhttps://www.scopus.com/pages/publications/85036457453en
local.type.statusPublisheden

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