Optimal and robust quantum-enhanced metrologywithout echoes
Date
Authors
Nolan, Samuel
Haine, Simon
Szigeti, Stuart
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Volume Title
Publisher
Optica Publishing Group
Access Statement
Abstract
We show that optimal and robust quantum metrology can be achieved without echoes. Specifically, we explore optimal measurement strategies with and without detection noise, and in both situations, find that echoes are unnecessary.
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Source
Type
Book Title
Quantum Information and Measurement, QIM 2017
Entity type
Publication