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Molecular dynamics simulations of the structure of latent tracks in quartz and amorphous SiO 2

dc.contributor.authorPakarinen, Olli
dc.contributor.authorDjurabekova, Flyura
dc.contributor.authorNordlund, Kai
dc.contributor.authorKluth, Patrick
dc.contributor.authorRidgway, Mark C
dc.date.accessioned2015-12-10T22:13:30Z
dc.date.available2015-12-10T22:13:30Z
dc.date.issued2009
dc.date.updated2016-02-24T10:00:28Z
dc.description.abstractSwift heavy ion irradiation (SHII) can leave a latent ion track around the ion path. Tracks in amorphous silicon dioxide (a-SiO2) and quartz are interesting due to applications in nanofabrication, for example. In recent experiments, a previously unresolved fine structure in latent ion tracks in a-SiO2 was found comprising a lower density core and a higher density shell. We model the formation of latent ion tracks in crystalline quartz and amorphous SiO2 using classical molecular dynamics (MD) to simulate the irradiation at the atomistic level, and compare the results to small angle X-ray scattering (SAXS) experiments on amorphous, 2 μm thick SiO2 layers. Electronic energy deposition of 197 Au ions corresponding to experiments is used in the simulations, to allow direct comparison between simulations and existing experiments. We explain the formation of the experimentally observed cylindrical core-shell structure with the dynamic simulations, and compare the obtained track dimensions and threshold energies with the experiment.
dc.identifier.issn0168-583X
dc.identifier.urihttp://hdl.handle.net/1885/49777
dc.publisherElsevier
dc.sourceNuclear Instruments and Methods in Physics Research: Section B
dc.subjectKeywords: Amorphous silicon dioxides; Atomistic levels; Classical molecular dynamics; Crystalline quartz; Cylindrical cores; Dynamic simulations; Electronic energy depositions; Fine structures; Ion irradiation; Ion paths; Latent ion tracks; Latent tracks; Lower den Ion irradiation; Quartz; Silica; Swift heavy ion tracks
dc.titleMolecular dynamics simulations of the structure of latent tracks in quartz and amorphous SiO 2
dc.typeJournal article
local.bibliographicCitation.issue8-9
local.bibliographicCitation.lastpage1459
local.bibliographicCitation.startpage1456
local.contributor.affiliationPakarinen, Olli, University of Helsinki
local.contributor.affiliationDjurabekova, Flyura, University of Helsinki
local.contributor.affiliationNordlund, Kai , University of Helsinki
local.contributor.affiliationKluth, Patrick, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationRidgway, Mark C, College of Physical and Mathematical Sciences, ANU
local.contributor.authoruidKluth, Patrick, u4054452
local.contributor.authoruidRidgway, Mark C, u9001886
local.description.notesImported from ARIES
local.identifier.absfor020499 - Condensed Matter Physics not elsewhere classified
local.identifier.ariespublicationu3488905xPUB192
local.identifier.citationvolume267
local.identifier.doi10.1016/j.nimb.2009.01.071
local.identifier.scopusID2-s2.0-65249107294
local.identifier.thomsonID000266519900061
local.type.statusPublished Version

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