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Generation of a phase-flipped Gaussian mode for optical measurements

Date

Authors

Delaubert, V.

Shaddock, Daniel

Lam, Ping Koy

Buchler, Benjamin

Bachor, Hans

McClelland, David

Publisher

Institute of Physics Publishing

Abstract

We propose optical techniques for the generation of a TEM00 Gaussian beam which has a π phase flip in the electric field amplitudes between the two halves of the beam profile. The methods make use of a special waveplate and a masked Sagnac interferometer

Keywords

Keywords: Electric fields; Interferometers; Interferometry; Laser beams; Light measurement; Light polarization; Displacement measurement; Gaussian beam; Gaussian intensity distribution; Sagnac interferometer; Spatial mode; Transverse electromagnetic; Laser modes Displacement measurement; Interferometry; Phase plate; Sagnac; Spatial mode

URI

http://hdl.handle.net/1885/94647

Collections

ANU Research Publications

Source

Journal of Optics A: Pure and Applied Optics

Type

Journal article

DOI

10.1088/1464-4258/4/4/305

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