Cultural advice

The Australian National University acknowledges, celebrates and pays our respects to the Ngunnawal and Ngambri people of the Canberra region and to all First Nations Australians on whose traditional lands we meet and work, and whose cultures are among the oldest continuing cultures in human history.

Aboriginal and Torres Strait Islander peoples are advised that ANU Library collections may include images, names, voices, and other representations of deceased persons.

Material in the collection may contain terms, language or views that reflect the period in which the item was created and may be considered inappropriate today.

Photo-ionisation spectra of single erbium centres by charge sensing with a nano transistor

Thumbnail Image

Date

2012

Authors

Yin, Chunming
Rancic, Milos
Stavrias, Nikolas
de Boo, Gabriele G.
McCallum, Jeffrey C.
Sellars, Matthew
Rogge, Sven

Journal Title

Journal ISSN

Volume Title

Publisher

IEEE

Abstract

We show the photo-ionisation of an individual erbium centre in silicon. A single-electron transistor is used as a charge detector to observe the resonant ionization as a function of photon energy. This allows for optical addressing and electrical detection of individual erbium centres with exceptionally narrow line width.

Description

Keywords

Keywords: Charge detectors; Charge sensing; Electrical detection; Narrow-line width; Optical addressing; Photon energy; Resonant ionization; Microelectronics; Photoionization; Erbium

Citation

URI

http://hdl.handle.net/1885/82958

Collections

ANU Research Publications

Source

Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD

Type

Conference paper

Book Title

Entity type

Access Statement

License Rights

DOI

10.1109/COMMAD.2012.6472428

Restricted until

2037-12-31

Downloads

File
Description
01_Yin_Photo-ionisation_spectra_of_2012.pdf (388.97 KB)

DSpace software copyright © 2002-2026 LYRASIS