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Disorder, structured diffuse scattering and the transmission electron microscope

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Withers, Raymond

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R Oldenbourg Verlag

Abstract

A review of the application of electron microscopy to disordered materials exhibiting sharp, highly structured diffuse intensity distributions is given from a modulation wave approach perspective. Structurally useful diffraction phenomena such as polarization, overall diffuse distribution shape and pseudo-extinction conditions are highlighted. The dangers of multiple scattering are emphasized before two particular such systems, substitutionally disordered solid solutions and inherently flexible framework structures are considered in more detail.

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Zeitschrift fur Kristallographie

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