Fast high-resolution micro-CT with exact reconstruction methods
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Varslot, Trond
Kingston, Andrew
Sheppard, Adrian
Sakellariou, Arthur
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SPIE - The International Society for Optical Engineering
Abstract
We have constructed a helical trajectory X-ray micro-CT system which enables high-resolution tomography within practical acquisition times. In the quest for ever-increasing resolution, lab-based X-ray micro-CT systems are limited by the spot size of the X-ray source. Unfortunately, decreasing the spot size reduces the X-ray flux, and therefore the signal-to-noise ratio (SNR). The reduced source flux can be offset by moving the detector closer to the source, thereby capturing a larger solid angle of the X-ray beam. We employ a helical scanning trajectory, accompanied by an exact reconstruction method to avoid the artifacts resulting from the use of large cone-angles with circular trajectories. In this paper, we present some challenges which arise when adopting this approach in a high-resolution cone-beam micro-CT system.
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Proceedings of SPIE - Progress in Biomedical Optics and Imaging
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2037-12-31
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