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Analysis of ultrathin high-efficiency silicon solar cells

dc.contributor.authorKray, Daniel
dc.contributor.authorMcIntosh, Keith
dc.date.accessioned2015-12-07T22:19:37Z
dc.date.issued2009
dc.date.updated2016-02-24T10:37:18Z
dc.description.abstractIn this paper we present experimental data on ultrathin silicon wafer solar cells as well as the analytical description of their open-circuit voltage and fill factor. For this we use the analytical model of Fischer and Plagwitz to describe the rear surface recombination that we extend for very low wafer thicknesses. We observe an unexpected drop of the cell voltage at∼40 μm thickness. This decrease cannot be described by the used models and is not reproduced via DESSIS simulations. From the new series resistance formula we can derive an analytical relationship for the fill factor. This allows us to perform a loss analysis of the cells and an optimization of the point contact pitch for different cell thicknesses.
dc.identifier.issn1862-6300
dc.identifier.urihttp://hdl.handle.net/1885/19425
dc.publisherWiley Interscience
dc.sourcePhysica Status Solidi A
dc.subjectKeywords: Analytical description; Analytical model; Cell voltages; Experimental data; Fill factor; High efficiency; Loss analysis; New series; Rear surfaces; Ultra-thin; Ultrathin silicon; Wafer thickness; Cell membranes; Electric potential; Optical losses; Photovo
dc.titleAnalysis of ultrathin high-efficiency silicon solar cells
dc.typeJournal article
local.bibliographicCitation.issue7
local.bibliographicCitation.lastpage1654
local.bibliographicCitation.startpage1647
local.contributor.affiliationKray, Daniel, Fraunhofer Institute
local.contributor.affiliationMcIntosh, Keith, College of Engineering and Computer Science, ANU
local.contributor.authoruidMcIntosh, Keith, u4249405
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.identifier.absfor090605 - Photodetectors, Optical Sensors and Solar Cells
local.identifier.ariespublicationu4137410xPUB8
local.identifier.citationvolume206
local.identifier.doi10.1002/pssa.200824500
local.identifier.scopusID2-s2.0-67650369833
local.identifier.thomsonID000268564200046
local.type.statusPublished Version

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