Effect of low energy implantation on the properties of Ti/Ni/Au contacts to n-SiC
| dc.contributor.author | Leech, Patrick W | |
| dc.contributor.author | Holland, A S | |
| dc.contributor.author | Reeves, G K | |
| dc.contributor.author | Pan, Yue | |
| dc.contributor.author | Ridgway, Mark C | |
| dc.contributor.author | Tanner, Phillip | |
| dc.coverage.spatial | TBC | |
| dc.date.accessioned | 2016-06-14T23:19:07Z | |
| dc.date.created | November 30-December 5 2014 | |
| dc.date.issued | 2015 | |
| dc.date.updated | 2016-06-14T08:32:34Z | |
| dc.description.abstract | The effect of low energy implantation of P or C ions in 3C-SiC on the properties of Ti/Ni/Au contacts has been examined for doses in the range 1013-1015 ions/cm2. Measurements of specific contact resistance, ρ <inf>c</inf>, were performed using the two-contact circular test structure. The magnitude of ρ<inf>c</inf> for the Ti/Ni/Au contacts on unimplanted SiC was 1.29 × 10-6 Ω.cm2. The value of ρ<inf>c</inf> increased significantly at an implant dose of 1 × 1015 ions/cm2. The dependence of ρ<inf>c</inf> on ion dose has been measured using both C and P implant species | |
| dc.identifier.isbn | 9781510806238 | |
| dc.identifier.uri | http://hdl.handle.net/1885/102757 | |
| dc.publisher | Conference Organising Committee | |
| dc.relation.ispartofseries | 2014 MRS Fall Meeting | |
| dc.source | Materials Research Society Symposium Proceedings | |
| dc.title | Effect of low energy implantation on the properties of Ti/Ni/Au contacts to n-SiC | |
| dc.type | Conference paper | |
| local.bibliographicCitation.lastpage | 44 | |
| local.bibliographicCitation.startpage | 39 | |
| local.contributor.affiliation | Leech, Patrick W, RMIT University | |
| local.contributor.affiliation | Holland, A S, RMIT University | |
| local.contributor.affiliation | Reeves, G K, RMIT University | |
| local.contributor.affiliation | Pan, Yue, RMIT University | |
| local.contributor.affiliation | Ridgway, Mark C, College of Physical and Mathematical Sciences, ANU | |
| local.contributor.affiliation | Tanner, Phillip, Griffith University | |
| local.contributor.authoruid | Ridgway, Mark C, u9001886 | |
| local.description.embargo | 2037-12-31 | |
| local.description.notes | Imported from ARIES | |
| local.description.refereed | Yes | |
| local.identifier.absfor | 020400 - CONDENSED MATTER PHYSICS | |
| local.identifier.absfor | 091200 - MATERIALS ENGINEERING | |
| local.identifier.absfor | 100700 - NANOTECHNOLOGY | |
| local.identifier.absseo | 970102 - Expanding Knowledge in the Physical Sciences | |
| local.identifier.ariespublication | a383154xPUB3288 | |
| local.identifier.doi | 10.1557/opl.2015.284 | |
| local.identifier.scopusID | 2-s2.0-84938842677 | |
| local.type.status | Published Version |
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