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Highly sensitive AMS measurements of 53Mn

Date

2010

Authors

Poutivtsev, M.
Dillman, I.
Faestermann, T.
Knie, K.
Korschinek, Gunther
Lachner, J.
Meier, A.
Rugel, G.
Wallner, Anton

Journal Title

Journal ISSN

Volume Title

Publisher

Elsevier

Abstract

Our AMS system, with the gas-filled detector system GAMS, has been optimized for measurements with 53Mn. A high sensitivity has been achieved. A newly installed cesium sputter ion source yields an improved emittance, and thus a higher mass resolution. By

Description

Keywords

53 Mn measurements, Emittances, Gas-filled detectors, High sensitivity, Highly sensitive, Mass resolution, Upper limits, Cesium, Cesium compounds, Chromium, Ion sources, Ions, Manganese oxide, Metal recovery, Manganese 53Mn measurements, AMS

Citation

Source

Nuclear Instruments and Methods in Physics Research: Section B

Type

Journal article

Book Title

Entity type

Access Statement

License Rights

DOI

10.1016/j.nimb.2009.10.023

Restricted until

2037-12-31