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Photonic Chip-Based Simultaneous Multi-Impairment Monitoring for Phase-Modulated Optical Signals

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Date

2010

Authors

Vo, Trung D.
Schroder, Jochen
Pelusi, Mark
Madden, Steve
Bulla, Douglas
Luther-Davies, Barry
Eggleton, Benjamin J
Choi, Duk-Yong

Journal Title

Journal ISSN

Volume Title

Publisher

Institute of Electrical and Electronics Engineers (IEEE Inc)

Abstract

We report the first experimental demonstration of simultaneous multi-impairment monitoring of phase-modulated 40 Gbit/s nonreturn to zero differential phase-shift keying (NRZ-DPSK) and 640 Gbit/s return-to-zero (RZ)-DPSK optical signals. Our approach exploits the femtosecond response time of the Kerr nonlinearity in a centimeter-scale, highly nonlinear, dispersion engineered chalcogenide planar waveguide to perform THz bandwidth RF spectrum analysis. The features observed on the radio-frequency (RF) spectrum are directly utilized to perform simultaneous group velocity dispersion and in-band optical signal-to-noise ratio (SNR) monitoring. We also numerically investigate the measurement accuracy of this monitoring technique, highlighting the advantages, and suitability of the chalcogenide rib waveguide.

Description

Keywords

Keywords: 40-Gbit/s; Chalcogenide rib waveguides; Differential phase-shift keying; Femtosecond response; Highly nonlinear; In-band optical signal-to-noise ratios; Kerr nonlinearity; Measurement accuracy; Monitoring techniques; Non-return to zeros; Optical performan Nonlinear optics; optical performance monitoring (OPM); optical planar waveguides; optical signal processing; spectrum analysis

Citation

URI

http://hdl.handle.net/1885/57303

Collections

ANU Research Publications

Source

Journal of Lightwave Technology

Type

Journal article

Book Title

Entity type

Access Statement

License Rights

DOI

10.1109/JLT.2010.2083635

Restricted until

2037-12-31

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02_Vo_Photonic_Chip-Based_2010.pdf (923.1 KB)

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