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Enhanced rear-side reflection and firing-stable surface passivation of silicon solar cells with capping polymer films

Date

Authors

Bullock, James

Thomson, Andrew

Cuevas, Andres

Veith, Boris

Schmidt, Jan

Karkkainen, Ari

Publisher

Wiley-VCH Verlag GMBH

Abstract

Low refractive index polymer materials have been investigated with a view to form the back surface mirror of advanced silicon solar cells. SiOx:H or AlOy SiOx:H polymer films were spun on top of an ultra-thin (<10 nm) atomic-layer-deposited (ALD) Al2O3

Keywords

Keywords: Aluminium oxide; Atomic layer deposited; Crystalline silicon wafers; Firing stability; Low refractive index; Photogenerated current; Surface passivation; Surface recombination velocities; Aluminum; Polymer films; Polymers; Refractive index; Semiconducting Aluminium oxide; Capping films; Firing stability; Silicon solar cells; Surface passivation

URI

http://hdl.handle.net/1885/73728

Collections

ANU Research Publications

Source

Physica Status Solidi: Rapid Research Letters

Type

Journal article

DOI

10.1002/pssr.201307200

Restricted until

2037-12-31

Downloads

File

Description

01_Bullock_Enhanced_rear-side_reflection_2013.pdf (369.91 KB)

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