Investigation of binary compounds using electron Rutherford backscattering
| dc.contributor.author | Went, M. R. | |
| dc.contributor.author | Vos, M. | |
| dc.date.accessioned | 2015-11-23T03:18:02Z | |
| dc.date.available | 2015-11-23T03:18:02Z | |
| dc.date.issued | 2007-02-13 | |
| dc.date.updated | 2015-12-08T10:58:01Z | |
| dc.description.abstract | High-energy (40keV) electrons, scattering over large angles, transfer a small fraction of their kinetic energy to the target atoms, in the same way as ions do in Rutherford backscattering experiments. The authors show here that this energy transfer can be resolved and used to determine the mass of the scattering atom. In this way information on the surface composition for thicknesses of the order of 10nm can be obtained. The authors refer to this technique as “electron Rutherford backscattering.” In addition the peak width reveals unique information about the vibrational properties (mean kinetic energy) of the scattering atoms. Here the authors demonstrate that the method can be used to identify a number of technologically important compounds. | |
| dc.description.sponsorship | This work is made possible by a grant of the Australian Research Council. | en_AU |
| dc.identifier.issn | 0003-6951 | en_AU |
| dc.identifier.uri | http://hdl.handle.net/1885/16603 | |
| dc.publisher | American Institute of Physics (AIP) | |
| dc.rights | http://www.sherpa.ac.uk/romeo/issn/0003-6951..."Publishers version/PDF may be used on author's personal website, institutional website or institutional repository" from SHERPA/RoMEO site (as at 23/11/15). Copyright 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters and may be found at https://doi.org/10.1063/1.2535986 | |
| dc.source | Applied Physics Letters | |
| dc.subject | Keywords: Electron scattering; Energy transfer; Ions; Molecular vibrations; Rutherford backscattering spectroscopy; Surface structure; Binary compounds; Electron Rutherford backscattering; Peak widths; Scattering atoms; Kinetic energy | |
| dc.title | Investigation of binary compounds using electron Rutherford backscattering | |
| dc.type | Journal article | |
| local.bibliographicCitation.issue | 7 | en_AU |
| local.bibliographicCitation.lastpage | 3 | |
| local.bibliographicCitation.startpage | 072104 | en_AU |
| local.contributor.affiliation | Went, Michael, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Atomic and Molecular Physics Laboratories, The Australian National University | en_AU |
| local.contributor.affiliation | Vos, Maarten, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Atomic and Molecular Physics Laboratories, The Australian National University | en_AU |
| local.contributor.authoruid | u3210150 | en_AU |
| local.description.notes | Imported from ARIES | en_AU |
| local.identifier.absfor | 020406 | en_AU |
| local.identifier.ariespublication | u4169254xPUB156 | en_AU |
| local.identifier.citationvolume | 90 | en_AU |
| local.identifier.doi | 10.1063/1.2535986 | en_AU |
| local.identifier.scopusID | 2-s2.0-33847129222 | |
| local.publisher.url | https://www.aip.org/ | en_AU |
| local.type.status | Published Version | en_AU |
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