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Switching spectroscopic measurement of surface potentials on ferroelectric surfaces via an open-loop Kelvin probe force microscopy method

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dc.contributor.authorLi, Qian
dc.contributor.authorLiu, Yun
dc.contributor.authorWang, Danyang
dc.contributor.authorWithers, Ray L.
dc.contributor.authorLi, Zhenrong
dc.contributor.authorLuo, Haosu
dc.contributor.authorXu, Zhuo
dc.date.accessioned2015-09-21T01:40:33Z
dc.date.available2015-09-21T01:40:33Z
dc.date.issued2012-12-12
dc.date.updated2016-02-24T08:53:32Z
dc.description.abstractWe report a method for switching spectroscopy Kelvin probe force microscopy (SS-KPFM). The method is established as a counterpart to switching spectroscopy piezoresponse force microscopy (SS-PFM) in Kelvin probe force microscopy. SS-KPFM yields quantitative information about the surface charge state during a local bias-induced polarization switching process, complementary to the electromechanical coupling properties probed via SS-PFM. Typical ferroelectric samples of a Pb-based relaxor single crystal and a BiFeO3 thin film were investigated using both methods. We briefly discuss the observed surfacecharging phenomena and their influence on the associated piezoresponse hysteresis loops.
dc.description.sponsorshipQ.L., Y.L., D.W., and R.L.W. acknowledge the support of the Australian Research Council (ARC) in the form of ARC Discovery Grants. Y.L. also acknowledges support from the ARC Future Fellowships Program.en_AU
dc.identifier.issn0003-6951en_AU
dc.identifier.urihttp://hdl.handle.net/1885/15591
dc.publisherAmerican Institute of Physics
dc.rightshttp://www.sherpa.ac.uk/romeo/issn/0003-6951..."Publishers version/PDF may be used on author's personal website, institutional website or institutional repository" from SHERPA/RoMEO site (as at 21/09/15). Copyright 2012 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters and may be found at https://dx.doi.org/10.1063/1.4772511
dc.sourceApplied Physics Letters
dc.subjectKeywords: Ferroelectric samples; Ferroelectric surfaces; Kelvin probe force microscopy; Piezoresponse; Piezoresponse force microscopy; Polarization switching; Quantitative information; Relaxor single crystals; Spectroscopic measurements; Surface charging; Electrome
dc.titleSwitching spectroscopic measurement of surface potentials on ferroelectric surfaces via an open-loop Kelvin probe force microscopy method
dc.typeJournal article
local.bibliographicCitation.issue24en_AU
local.bibliographicCitation.lastpage5
local.bibliographicCitation.startpage242906en_AU
local.contributor.affiliationLi, Qian, College of Physical and Mathematical Sciences, CPMS Research School of Chemistry, RSC General, The Australian National Universityen_AU
local.contributor.affiliationLiu, Yun, College of Physical and Mathematical Sciences, CPMS Research School of Chemistry, RSC General, The Australian National Universityen_AU
local.contributor.affiliationWang, Danyang, University of New South Wales, Australiaen_AU
local.contributor.affiliationWithers, Raymond, College of Physical and Mathematical Sciences, CPMS Research School of Chemistry, RSC General, The Australian National Universityen_AU
local.contributor.affiliationLi, Zhenrong, Xian Jiaotong University, Chinaen_AU
local.contributor.affiliationLuo, Haosu, Chinese Academy of Science, Chinaen_AU
local.contributor.affiliationXu, Zhou, Xian Jiaotong University, Chinaen_AU
local.contributor.authoruidu4836728en_AU
local.description.notesImported from ARIESen_AU
local.identifier.absfor030206en_AU
local.identifier.absseo970103en_AU
local.identifier.ariespublicationf5625xPUB2053en_AU
local.identifier.citationvolume101en_AU
local.identifier.doi10.1063/1.4772511en_AU
local.identifier.scopusID2-s2.0-84871270669
local.identifier.thomsonID000312490000067
local.publisher.urlhttps://www.aip.org/en_AU
local.type.statusPublished Versionen_AU

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