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Disorder in Au and Cu Nanocrystals formed by Ion Implantation into Thin SiO 2

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Date

2005

Authors

Kluth, Patrick
Johannessen, Bernt
Glover, Christopher
Foran, Garry J
Ridgway, Mark C

Journal Title

Journal ISSN

Volume Title

Publisher

Elsevier

Abstract

Au and Cu nanocrystals (NCs) fabricated by ion implantation into thin SiO2 and annealing were investigated by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and transmission electron microscopy (TEM). In particular, the EXAFS Debye-Waller (D-W) factor is studied as a function of the annealing temperature. An increased D-W factor was observed for annealing temperatures 500 °C and 800 °C with respect to samples as implanted and annealed at 1100 °C. A possible explanation for this behavior could be stress induced plastic deformation due to the different thermal expansion of the metals and the SiO2.

Description

Keywords

Keywords: Annealing; Copper; Gold; Ion implantation; Plastic deformation; Silica; Thermal expansion; Transmission electron microscopy; X ray spectroscopy; Disorder; EXAFS; Nanocrystals; SiO2; Nanostructured materials Disorder; EXAFS; Ion implantation; Nanocrystals

Citation

URI

http://hdl.handle.net/1885/81568

Collections

ANU Research Publications

Source

Nuclear Instruments and Methods in Physics Research: Section B

Type

Journal article

Book Title

Entity type

Access Statement

License Rights

DOI

10.1016/j.nimb.2005.06.185

Restricted until

2037-12-31

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01_Kluth_Disorder_in_Au_and_Cu_2005.pdf (189.22 KB)

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