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Micrometer-scale deep-level spectral photoluminescence from dislocations in multicrystalline silicon

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dc.contributor.authorNguyen, Hieu T.
dc.contributor.authorRougieux, Fiacre E.
dc.contributor.authorWang, Fan
dc.contributor.authorTan, Hark Hoe
dc.contributor.authorMacdonald, Daniel
dc.date.accessioned2015-09-10T06:49:56Z
dc.date.available2015-09-10T06:49:56Z
dc.date.issued2015-05
dc.description.abstractMicrometer-scale deep-level spectral photoluminescence (PL) from dislocations is investigated around the subgrain boundaries in multicrystalline silicon. The spatial distribution of the D lines is found to be asymmetrically distributed across the subgrain boundaries, indicating that defects and impurities are decorated almost entirely on one side of the subgrain boundaries. In addition, the D1 and D2 lines are demonstrated to have different origins due to their significantly varying behaviors after processing steps. D1 is found to be enhanced when the dislocations are cleaned of metal impurities, whereas D2 remains unchanged. Finally, the D4 and D3 lines are proposed to have different origins since their energy levels are shifted differently as a function of distance from the subgrain boundaries.en_AU
dc.identifier.issn2156-3381en_AU
dc.identifier.urihttp://hdl.handle.net/1885/15331
dc.publisherIEEEen_AU
dc.rights© 2015 IEEE. http://www.sherpa.ac.uk/romeo/issn/2156-3381/..."Author's post-print on Author's server or Institutional server" from SHERPA/RoMEO site (as at 14/09/15).en_AU
dc.sourceIEEE Journal of Photovoltaicsen_AU
dc.titleMicrometer-scale deep-level spectral photoluminescence from dislocations in multicrystalline siliconen_AU
dc.typeJournal articleen_AU
local.bibliographicCitation.issue3en_AU
local.bibliographicCitation.lastpage804en_AU
local.bibliographicCitation.startpage799en_AU
local.contributor.affiliationNguyen, H. T., Research School of Engineering, The Australian National Universityen_AU
local.contributor.authoruidu5247402en_AU
local.identifier.ariespublicationa383154xPUB1484
local.identifier.citationvolume5en_AU
local.identifier.doi10.1109/JPHOTOV.2015.2407158en_AU
local.publisher.urlhttp://www.ieee.org/index.htmlen_AU
local.type.statusAccepted Versionen_AU

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