Contrast Enhancement of Luminescence Images via Point-Spread Deconvolution

Date

2012

Authors

Walters, Daniel
Liu, An Yao
Franklin, Evan
MacDonald, Daniel
Mitchell, Bernhard
Trupke, T

Journal Title

Journal ISSN

Volume Title

Publisher

Curran Associates, Inc.

Abstract

We investigate the impact of point-spread in the silicon CCD sensor of a BT Imaging LIS-R1 luminescence imaging system. It is found that an experimental definition of the point-spread function allows for a significant restoration of CCD point-spread to be achieved. A comparison with short-pass filtering is performed, demonstrating that point-spread will still have a measurable influence on image quality while reducing the luminescence signal and increasing the relative noise level. An implementation of point-spread deconvolution is presented at a multi-crystalline silicon grain boundary, illustrating a practical enhancement of resolution in a typical high-contrast scenario. The characteristics of the point-spread presented here are specific to the experimental apparatus investigated, but the procedure described is universally applicable.

Description

Keywords

Keywords: CCD sensors; Contrast Enhancement; Experimental apparatus; High contrast; Luminescence imaging; Luminescence signals; Multi-crystalline silicon; Noise levels; Point-Spread function; Deconvolution; Grain boundaries; Luminescence deconvolution; luminescence imaging; point-spread function

Citation

Source

Proceedings of the 38th IEEE Photovoltaic Specialists Conference (PVSC)

Type

Conference paper

Book Title

Entity type

Access Statement

License Rights

DOI

10.1109/PVSC.2012.6317624

Restricted until

2037-12-31