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Synthesis and characterization of ion-implanted Pt nanocrystals in SiO 2

Date

Authors

Giulian, Raquel

Kluth, Patrick

Johannessen, Bernt

Araujo, Leandro

Llewellyn, David

Cookson, D J

Ridgway, Mark C

Publisher

Elsevier

Abstract

Pt nanocrystals (NCs) produced by ion implantation in SiO2 films were investigated by Rutherford backscattering spectroscopy (RBS), transmission electron microscopy (TEM) and small angle X-ray scattering (SAXS). The implantations were performed at liquid

Keywords

Keywords: Characterization; Ion implantation; Platinum; Rutherford backscattering spectroscopy; Synthesis (chemical); Transmission electron microscopy; Defect nucleation; Liquid nitrogen temperature; Nanocrystal nucleation; Pt nanocrystals (NC); Nanocrystals Ion implantation; Pt nanocrystals; SAXS; TEM

URI

http://hdl.handle.net/1885/26764

Collections

ANU Research Publications

Source

Nuclear Instruments and Methods in Physics Research: Section B

Type

Journal article

DOI

10.1016/j.nimb.2006.12.139

Restricted until

2037-12-31

Downloads

File

Description

01_Giulian_Synthesis_and_characterization_2007.pdf (288.64 KB)

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