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Picosecond Time-Resolved Bleaching Dynamics of Self-Assembled Quantum Dots

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dc.contributor.authorBogaart, E Wen_AU
dc.contributor.authorHaverkort, J E Men_AU
dc.contributor.authorMano, Ten_AU
dc.contributor.authorNotzel, Richarden_AU
dc.contributor.authorWolter, Joachimen_AU
dc.contributor.authorLever McGowan, Penelopeen_AU
dc.contributor.authorJagadish, Chennupatien_AU
dc.contributor.authorTan, Hark Hoeen_AU
dc.date.accessioned2015-12-13T22:40:55Z
dc.date.available2015-12-13T22:40:55Z
dc.date.issued2004
dc.date.updated2015-12-11T09:57:57Z
dc.description.abstractPicosecond bleaching dynamics of vertically stacked self-assembled quantum dots (QDs) is investigated by means of time-resolved pump-probe differential reflection spectroscopy (TRDR) at room temperature (RT). We observe that the absorption spectrum, which represents the QD density of states at RT, is strongly shifted with respect to the photoluminescence spectrum. This shift can not be interpreted by carrier emission and re-trapping alone. TRDR allows us to study the dynamics of the pump generated carriers within the QDs. From the time-resolved measurements, we detect that the bleaching decay time has a strong energy dependence and is dominated by radiative and nonradiative recombination at low energy and by carrier emission at high energy.
dc.identifier.issn1536-125X
dc.identifier.urihttp://hdl.handle.net/1885/78271
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE Inc)
dc.sourceIEEE Transactions on Nanotechnology
dc.subjectKeywords: Absorption; Atomic force microscopy; Electron traps; Molecular beam epitaxy; Optical switches; Photoluminescence; Pumping (laser); Semiconductor lasers; Spectrum analysis; Bleaching (quantum dots); Bleaching decay time; Time resolved; Time resolved pump-p Bleaching; Dynamics; Quantum dots (QDs); Spectroscopy; Time resolved
dc.titlePicosecond Time-Resolved Bleaching Dynamics of Self-Assembled Quantum Dots
dc.typeJournal article
local.bibliographicCitation.issue3
local.bibliographicCitation.lastpage352
local.bibliographicCitation.startpage348
local.contributor.affiliationBogaart, E W, Eindhoven University of Technology
local.contributor.affiliationHaverkort, J E M, Eindhoven University of Technology
local.contributor.affiliationMano, T, Eindhoven University of Technology
local.contributor.affiliationNotzel, Richard, Eindhoven University of Technology
local.contributor.affiliationWolter, Joachim, Eindhoven University of Technology
local.contributor.affiliationLever McGowan, Penelope, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationTan, Hoe Hark, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationJagadish, Chennupati, College of Physical and Mathematical Sciences, ANU
local.contributor.authoruidLever McGowan, Penelope, u9915543
local.contributor.authoruidTan, Hoe Hark, u9302338
local.contributor.authoruidJagadish, Chennupati, u9212349
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor090699 - Electrical and Electronic Engineering not elsewhere classified
local.identifier.ariespublicationMigratedxPub6941
local.identifier.citationvolume3
local.identifier.doi10.1109/TNANO.2004.828572
local.identifier.scopusID2-s2.0-4544298155
local.type.statusPublished Version

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