Thickness-dependent phase transformation in nanoindented germanium thin films
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Oliver, David
Bradby, Jodie
Williams, James
Swain, Michael Vincent
Munroe, Paul
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Institute of Physics Publishing
Abstract
We investigate the mechanical response of 50-600 nm epitaxial Ge films on a Si substrate using nanoindentation with a nominally spherical (R≈4.3 νm) diamond tip. The inelastic deformation mechanism is found to depend critically on the film thickness. S
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Nanotechnology