Enhanced Electrical Activation in In-Implanted Si0.35Ge0.65 by C Co-Doping
| dc.contributor.author | Feng, Ruixing | |
| dc.contributor.author | Kremer, Felipe | |
| dc.contributor.author | Sprouster, D. J. | |
| dc.contributor.author | Mirzaei, Sahar | |
| dc.contributor.author | Decoster, Stefan | |
| dc.contributor.author | Glover, C J | |
| dc.contributor.author | Medling, Scott | |
| dc.contributor.author | Hansen, John L | |
| dc.contributor.author | Nylandsted-Larsen, A | |
| dc.contributor.author | Russo, Salvy P | |
| dc.contributor.author | Ridgway, Mark C | |
| dc.date.accessioned | 2021-06-15T05:08:25Z | |
| dc.date.available | 2021-06-15T05:08:25Z | |
| dc.date.issued | 2017 | |
| dc.date.updated | 2020-11-23T10:29:12Z | |
| dc.description.abstract | In this report, we have achieved a significant increase in the electrically active dopant fraction in Indium (In)-implanted Si0.35Ge0.65, by co-doping with the isovalent element Carbon (C). Electrical measurements have been correlated with X-ray absorption spectroscopy to determine the electrical properties and the In atom lattice location. With C+ In co-doping, the solid solubility of In in Si0.35Ge0.65 was at least tripled from between 0.02 and 0.06 at% to between 0.2 and 0.6 at% as a result of C-In pair formation, which suppressed In metal precipitation. A dramatic improvement of electrical properties was thus attained in the co-doped samples. | en_AU |
| dc.description.sponsorship | We also thank the Australian Research Council and Australian Synchrotron for support. | en_AU |
| dc.format.mimetype | application/pdf | en_AU |
| dc.identifier.issn | 2166-3831 | en_AU |
| dc.identifier.uri | http://hdl.handle.net/1885/237363 | |
| dc.language.iso | en_AU | en_AU |
| dc.provenance | This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. | en_AU |
| dc.publisher | Taylor and Francis | en_AU |
| dc.rights | © 2016 The Authors | en_AU |
| dc.rights.license | Creative Commons Attribution licence | en_AU |
| dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | en_AU |
| dc.source | Materials Research Letters | en_AU |
| dc.source.uri | https://www.tandfonline.com/doi/full/10.1080/21663831.2016.1169229 | en_AU |
| dc.subject | SiGe | en_AU |
| dc.subject | C + In co-doping | en_AU |
| dc.subject | X-ray absorption fine structure | en_AU |
| dc.subject | Hall Effect | en_AU |
| dc.title | Enhanced Electrical Activation in In-Implanted Si0.35Ge0.65 by C Co-Doping | en_AU |
| dc.type | Journal article | en_AU |
| dcterms.accessRights | Open Access | en_AU |
| local.bibliographicCitation.issue | 1 | en_AU |
| local.bibliographicCitation.lastpage | 34 | en_AU |
| local.bibliographicCitation.startpage | 29 | en_AU |
| local.contributor.affiliation | Feng, Ruixing, College of Engineering and Computer Science, ANU | en_AU |
| local.contributor.affiliation | Kremer, Felipe, College of Science, ANU | en_AU |
| local.contributor.affiliation | Sprouster, D. J., Brookhaven National Laboratory | en_AU |
| local.contributor.affiliation | Mirzaei, Sahar, College of Science, ANU | en_AU |
| local.contributor.affiliation | Decoster, Stefan, KU Leuven | en_AU |
| local.contributor.affiliation | Glover, C J, Australian Synchrotron | en_AU |
| local.contributor.affiliation | Medling, Scott, College of Science, ANU | en_AU |
| local.contributor.affiliation | Hansen, John L, Aarhus University | en_AU |
| local.contributor.affiliation | Nylandsted-Larsen, A, University of Aarhus | en_AU |
| local.contributor.affiliation | Russo, Salvy P, RMIT University | en_AU |
| local.contributor.affiliation | Ridgway, Mark C, College of Science, ANU | en_AU |
| local.contributor.authoruid | Feng, Ruixing, u4886697 | en_AU |
| local.contributor.authoruid | Kremer, Felipe, u5077096 | en_AU |
| local.contributor.authoruid | Mirzaei, Sahar, u5056320 | en_AU |
| local.contributor.authoruid | Medling, Scott, u5434598 | en_AU |
| local.contributor.authoruid | Ridgway, Mark C, u9001886 | en_AU |
| local.description.notes | Imported from ARIES | en_AU |
| local.identifier.absfor | 020406 - Surfaces and Structural Properties of Condensed Matter | en_AU |
| local.identifier.absseo | 970102 - Expanding Knowledge in the Physical Sciences | en_AU |
| local.identifier.ariespublication | u4485658xPUB890 | en_AU |
| local.identifier.citationvolume | 5 | en_AU |
| local.identifier.doi | 10.1080/21663831.2016.1169229 | en_AU |
| local.identifier.scopusID | 2-s2.0-84981736247 | |
| local.identifier.thomsonID | 000398624400003 | |
| local.publisher.url | https://www.tandfonline.com | en_AU |
| local.type.status | Published Version | en_AU |
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