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Temperature-dependent mechanical deformation of silicon at the nanoscale: Phase transformation versus defect propagation

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Date

2015

Authors

Mangalampalli, S.R.N. Kiran
Tran, Tuan
Smillie, Lachlan
Haberl, Bianca
Subianto, Denny
Williams, James
Bradby, Jodie

Journal Title

Journal ISSN

Volume Title

Publisher

American Institute of Physics (AIP)

Abstract

This study uses high-temperature nanoindentation coupled with in situ electrical measurements to investigate the temperature dependence (25-200°C) of the phase transformation behavior of diamond cubic (dc) silicon at the nanoscale. Along with in situ ind

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Keywords

Citation

URI

http://hdl.handle.net/1885/70493

Collections

ANU Research Publications

Source

Journal of Applied Physics

Type

Journal article

Book Title

Entity type

Access Statement

Open Access

License Rights

DOI

10.1063/1.4921534

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01_Mangalampalli_Temperature-dependent_2015.pdf (2.09 MB)

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