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The Hyperion TM Ion Probe for Next Generation FIB, SIMS and Nano-Ion Implantation

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dc.contributor.authorSmith, N S
dc.contributor.authorTesch, P. P.
dc.contributor.authorMartin, N. P.
dc.contributor.authorBoswell, Roderick
dc.date.accessioned2015-12-07T22:33:37Z
dc.date.issued2009
dc.date.updated2015-12-07T10:34:19Z
dc.identifier.issn1431-9276
dc.identifier.urihttp://hdl.handle.net/1885/23364
dc.publisherCambridge University Press
dc.sourceMicroscopy and Microanalysis
dc.titleThe Hyperion TM Ion Probe for Next Generation FIB, SIMS and Nano-Ion Implantation
dc.typeJournal article
local.bibliographicCitation.issueSupplement 2
local.bibliographicCitation.lastpage313
local.bibliographicCitation.startpage312
local.contributor.affiliationSmith, N S, Oregon Physics
local.contributor.affiliationTesch, P. P. , Oregon Physics
local.contributor.affiliationMartin, N. P., Oregon Physics
local.contributor.affiliationBoswell, Roderick, College of Physical and Mathematical Sciences, ANU
local.contributor.authoruidBoswell, Roderick, u8000743
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.identifier.absfor020204 - Plasma Physics; Fusion Plasmas; Electrical Discharges
local.identifier.ariespublicationu4735977xPUB26
local.identifier.citationvolume15
local.identifier.doi10.1017/S1431927609095300
local.identifier.scopusID2-s2.0-69949188069
local.identifier.thomsonID000208119100154
local.type.statusPublished Version

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