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Electronic properties of (Ga,Mn)N thin films with high Mn content

dc.contributor.authorGranville, S.
dc.contributor.authorRuck, B. J.
dc.contributor.authorPreston, A. R. H.
dc.contributor.authorStewart, T.
dc.contributor.authorBudde, F.
dc.contributor.authorTrodahl, H. J.
dc.contributor.authorBittar, A.
dc.contributor.authorDownes, J. E.
dc.contributor.authorRidgway, M.
dc.date.accessioned2015-10-21T23:20:42Z
dc.date.available2015-10-21T23:20:42Z
dc.date.issued2008-11-19
dc.date.updated2016-02-24T10:00:19Z
dc.description.abstractOptical and dc resistivity measurements as well as x-ray spectroscopies have been performed on (Ga,Mn)N films containing Mn at up to 11 at. %. The results indicate that at higher Mn contents, the Fermi level is situated within extended states, while GaN host interband optical transitions are unaffected. The Mn state is confirmed to be 3d⁵, as in the case of lower Mn content films; however, the high Mn content merges the 3d levels into a band located just below the host conduction band. The Fermi level is located within these Mn states just below the conduction band, in sharp contrast to its midgap position in fully crystalline, low Mn concentration materials. The difference in the position of the Fermi level at high Mn dopant levels has important implications for the promotion of ferromagnetism in this material.
dc.description.sponsorshipThe authors gratefully acknowledge financial support from the New Zealand Foundation for Research Science and Technology through its New Economy Research Fund and through a postdoctoral fellowship of one of the authors B.J.R.. The work of the MacDiarmid Institute is supported by a New Zealand Centre of Research Excellence award. Another author S.G. wishes to thank Education New Zealand for financial support of the XANES measurements.en_AU
dc.format5 pages
dc.identifier.issn0021-8979en_AU
dc.identifier.urihttp://hdl.handle.net/1885/16015
dc.publisherAmerican Institute of Physics (AIP)
dc.rightshttp://www.sherpa.ac.uk/romeo/issn/0021-8979..."Publishers version/PDF may be used on author's personal website, institutional website or institutional repository" from SHERPA/RoMEO site (as at 22/10/15). Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics and may be found at https://doi.org/10.1063/1.3020536
dc.sourceJournal of Applied Physics
dc.subjectKeywords: Conduction bands; Electric conductivity; Electric currents; Electron mobility; Electronic properties; Fermi level; Fermions; Gallium nitride; Heat conduction; Manganese; Semiconducting gallium; Thick films; Three dimensional; Dc resistivities; Dopant leve
dc.titleElectronic properties of (Ga,Mn)N thin films with high Mn content
dc.typeJournal article
local.bibliographicCitation.issue10en_AU
local.bibliographicCitation.lastpage5
local.bibliographicCitation.startpage103710en_AU
local.contributor.affiliationGranville, S, Victoria University of Wellington, New Zealanden_AU
local.contributor.affiliationRuck, B J , Victoria University of Wellington , New Zealanden_AU
local.contributor.affiliationPreston, A R H, Victoria University of Wellington, New Zealanden_AU
local.contributor.affiliationStewart, T, Victoria University of Wellington, New Zealanden_AU
local.contributor.affiliationBudde, F, Victoria University of Wellington, New Zealanden_AU
local.contributor.affiliationTrodahl , H J , Victoria University of Wellington, New Zealanden_AU
local.contributor.affiliationBittar, A , Industrial Research Ltd , New Zealanden_AU
local.contributor.affiliationDownes, J E, Macquarie University, Australiaen_AU
local.contributor.affiliationRidgway, Mark C, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.authoruidRidgway, Mark C, u9001886
local.description.notesImported from ARIESen_AU
local.identifier.absfor020499en_AU
local.identifier.ariespublicationu3488905xPUB176en_AU
local.identifier.citationvolume104en_AU
local.identifier.doi10.1063/1.3020536en_AU
local.identifier.scopusID2-s2.0-57049128197
local.identifier.thomsonID000262605800076
local.publisher.urlhttps://www.aip.org/en_AU
local.type.statusPublished Versionen_AU

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