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Nanoindentation-induced phase transformation in relaxed and unrelaxed ion-implanted amorphous germanium

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dc.contributor.authorOliver, D. J.
dc.contributor.authorBradby, J. E.
dc.contributor.authorRuffell, S.
dc.contributor.authorWilliams, J. S.
dc.contributor.authorMunroe, P.
dc.date.accessioned2015-10-22T02:06:12Z
dc.date.available2015-10-22T02:06:12Z
dc.date.issued2009-11-06
dc.date.updated2016-02-24T10:00:47Z
dc.description.abstractWe have investigated nanoindentation-induced plastic deformation in amorphousgermanium (a-Ge) prepared by high-energy self-ion implantation. Using cross-sectional transmission electron microscopy, micro-Raman spectroscopy, and force-displacement curve analysis, we find strong evidence for a pressure-induced metallic phase transformation during indentation. Crystalline diamond-cubic Ge-I is observed in residual indents. Relaxed and unrelaxed structural states of a-Ge exhibit similar behavior on loading, but transform at different pressures on unloading. Both forms are markedly softer mechanically than crystalline Ge. These results assist in furthering the understanding of the intriguing phenomenon known as “explosive crystallization.”
dc.description.sponsorshipWe thank the Australian Research Council for funding support.en_AU
dc.identifier.issn0021-8979en_AU
dc.identifier.urihttp://hdl.handle.net/1885/16029
dc.publisherAmerican Institute of Physics (AIP)
dc.rightshttp://www.sherpa.ac.uk/romeo/issn/0021-8979..."Publishers version/PDF may be used on author's personal website, institutional website or institutional repository" from SHERPA/RoMEO site (as at 22/10/15). Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics and may be found at https://doi.org/10.1063/1.3255999
dc.sourceJournal of Applied Physics
dc.subjectKeywords: Amorphous germanium; Cross sectional transmission electron microscopy; Crystalline Ge; Explosive crystallizations; Force-displacement curves; High energy; Induced phase transformation; Metallic phase; Micro Raman Spectroscopy; Residual indent; Self-ion im
dc.titleNanoindentation-induced phase transformation in relaxed and unrelaxed ion-implanted amorphous germanium
dc.typeJournal article
local.bibliographicCitation.issue9en_AU
local.bibliographicCitation.lastpage6
local.bibliographicCitation.startpage093509en_AU
local.contributor.affiliationOliver, David, McGill University, Canadaen_AU
local.contributor.affiliationBradby, Jodie, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationRuffell, Simon, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationWilliams, James, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationMunroe, Paul, University of New South Wales, Australiaen_AU
local.contributor.authoruidu9908195en_AU
local.description.notesImported from ARIESen_AU
local.identifier.absfor020499en_AU
local.identifier.ariespublicationu3488905xPUB204en_AU
local.identifier.citationvolume106en_AU
local.identifier.doi10.1063/1.3255999en_AU
local.identifier.scopusID2-s2.0-70450277816
local.identifier.thomsonID000272555700025
local.publisher.urlhttps://www.aip.org/en_AU
local.type.statusPublished Versionen_AU

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