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Size-dependent Structural Disorder in Nanocrystalline Cu Probed by Synchrotron-based X-ray Techniques

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dc.contributor.authorJohannessen, Bernt
dc.contributor.authorKluth, Patrick
dc.contributor.authorCookson, D J
dc.contributor.authorForan, Garry J
dc.contributor.authorRidgway, Mark C
dc.date.accessioned2015-12-13T23:26:24Z
dc.date.issued2006
dc.date.updated2015-12-12T09:46:25Z
dc.description.abstractElemental Cu nanocrystals were synthesized in thin film SiO2 by ion implantation and thermal annealing. The local atomic structure and nanocrystal size distribution were investigated by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. We quantify the bondlength contraction and increased structural disorder in the nanocrystals as compared to a bulk Cu reference. Both are proportional to the inverse of the nanocrystal diameter, which in turn is proportional to the surface-area-to-volume ratio. In particular we show that a simple liquid-drop model can explain the bondlength contraction and estimate the surface tension of nanocrystalline Cu to be 3.8 ± 0.4 J/m2.
dc.identifier.issn0168-583X
dc.identifier.urihttp://hdl.handle.net/1885/92812
dc.publisherElsevier
dc.sourceNuclear Instruments and Methods in Physics Research: Section B
dc.subjectKeywords: Annealing; Copper; Silicon compounds; Surface tension; Synchrotrons; Thin films; X ray analysis; X ray scattering; Bondlength contractions; Extended X-ray absorption fine structure (EXAFS); Ion implantations; Small angle X-ray scattering (SAXS); Nanostruc EXAFS; Ion implantation; Nanocrystals; SAXS
dc.titleSize-dependent Structural Disorder in Nanocrystalline Cu Probed by Synchrotron-based X-ray Techniques
dc.typeJournal article
local.bibliographicCitation.lastpage49
local.bibliographicCitation.startpage45
local.contributor.affiliationJohannessen, Bernt, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationKluth, Patrick, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationCookson, D J, Australian Nuclear Science and Technology Organisation
local.contributor.affiliationForan, Garry J, Australian Nuclear Science and Technology Organisation
local.contributor.affiliationRidgway, Mark C, College of Physical and Mathematical Sciences, ANU
local.contributor.authoruidJohannessen, Bernt, u3985823
local.contributor.authoruidKluth, Patrick, u4054452
local.contributor.authoruidRidgway, Mark C, u9001886
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor020406 - Surfaces and Structural Properties of Condensed Matter
local.identifier.ariespublicationMigratedxPub26036
local.identifier.citationvolume246
local.identifier.doi10.1016/j.nimb.2005.12.015
local.identifier.scopusID2-s2.0-33645886358
local.type.statusPublished Version

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