SiO x /GeO x nanowires grown via the active oxidation of Si/Ge substrates

dc.contributor.authorCollin, Gabriel
dc.contributor.authorShalav, Avi
dc.contributor.authorElliman, Robert
dc.date.accessioned2015-12-07T22:39:30Z
dc.date.available2015-12-07T22:39:30Z
dc.date.issued2012
dc.date.updated2016-02-24T11:10:08Z
dc.description.abstractSilica nanowires have recently been grown via the vapor-liquid-solid growth mechanism where the vapor precursor is obtained directly from the substrate via active oxidation processes. In this study, we extend this technique to the Ge-O system and show that Au coated Ge substrates can be used as a volatile GeO source, resulting in germania nanowire formation above 550°C. The process is highly dependent on Au and native oxide thickness', the partial pressure of O2 and annealing temperature. If the oxide layer is too thick, the bare wafer is protected from the active oxidation process. However, if the oxide layer is too thin, it will be readily decomposed leaving no stable surface for nanowires to grow and only an etched surface is observed. In this study we show that a native Ge oxide is unstable and that a thicker oxide is required as a buffer layer, separating active oxidation and nanowire nucleation processes. We also show that nanowires can be grown on stable oxide particles present on the Ge wafer surface.
dc.identifier.issn0255-5476
dc.identifier.urihttp://hdl.handle.net/1885/23893
dc.publisherTrans Tech Publications
dc.sourceMaterials Science Forum
dc.subjectKeywords: Annealing temperatures; Etched surface; Ge substrates; Ge wafer; Germania; Nanowire formation; Native oxide thickness; Nucleation process; Oxidation process; Oxide layer; Si/Ge; Silica nano wires; Stable oxides; Stable surfaces; Vapor-liquid-solid growth Active oxidation; Germania; Germanium; Nanowires; Silica; Silicon
dc.titleSiO x /GeO x nanowires grown via the active oxidation of Si/Ge substrates
dc.typeJournal article
local.bibliographicCitation.lastpage136
local.bibliographicCitation.startpage133
local.contributor.affiliationCollin, Gabriel, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationShalav, Avi, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationElliman, Robert, College of Physical and Mathematical Sciences, ANU
local.contributor.authoremailu9012877@anu.edu.au
local.contributor.authoruidCollin, Gabriel, u4524308
local.contributor.authoruidShalav, Avi, u4479768
local.contributor.authoruidElliman, Robert, u9012877
local.description.notesImported from ARIES
local.identifier.absfor100712 - Nanoscale Characterisation
local.identifier.absfor100708 - Nanomaterials
local.identifier.ariespublicationu4479768xPUB29
local.identifier.citationvolume700
local.identifier.doi10.4028/www.scientific.net/MSF.700.133
local.identifier.scopusID2-s2.0-80053938129
local.identifier.thomsonID000302673700031
local.identifier.uidSubmittedByu4479768
local.type.statusPublished Version

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