Physical and optical characterisation of Ge-implanted silica
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Dowd, A
Llewellyn, David
Elliman, Robert
Luther-Davies, Barry
Samoc, Marek
Fitz Gerald, John
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Elsevier
Abstract
Ge nanocrystals formed in silica by implantation with 1.0 MeV Ge ions and subsequent annealing at 1100°C were characterised by transmission electron microscopy and Raman spectroscopy. The nanocrystals were found to be approximately spherical in shape and
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Nuclear Instruments and Methods in Physics Research: Section B
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2037-12-31
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