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Local degradation of electroluminescent emission centers in ZnS:Cu,Cl phosphors

Date

Authors

Medling, Scott

Bridges, F.

Carter, S.A.

Publisher

Elsevier

Abstract

ZnS:Cu contains needle-shaped, CuS conducting nano-precipitates along the [111] planes which amplify the applied electric fields near the tips when the field is reversed, enabling AC electroluminescence for ∼50μm thick devices at AC voltages of ∼100V

Keywords

Keywords: Ac voltage; Degradation process; Device degradation; Emission centers; High-field regions; Local degradation; Microscope images; Multi-step; Nanoprecipitates; Primary degradation mechanism; Trap state; Degradation; Diodes; Drops; Electric fields; Light em AC electroluminescence; Degradation; Phosphor

URI

http://hdl.handle.net/1885/64831

Collections

ANU Research Publications

Source

Journal of Luminescence

Type

Journal article

DOI

10.1016/j.jlumin.2012.08.037

Restricted until

2037-12-31

Downloads

File

Description

01_Medling_Local_degradation_of_2013.pdf (842.38 KB)