AND/R: Advanced neutron diffractometer/reflectometer for investigation of thin films and multilayers for the life sciences
Date
2006-07-20
Authors
Dura, Joseph A.
Pierce, Donald J.
Majkrzak, Charles F.
Maliszewskyj, Nicholas C.
McGillivray, Duncan J.
Lösche, Mathias
O’Donovan, Kevin V.
Mihailescu, Mihaela
Perez-Salas, Ursula
Worcester, David L.
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American Institute of Physics (AIP)
Abstract
An elastic neutron scattering instrument, the advanced neutron diffractometer/reflectometer (AND/R), has recently been commissioned at the National Institute of Standards and Technology Center for Neutron Research. The AND/R is the centerpiece of the Cold Neutrons for Biology and Technology partnership, which is dedicated to the structural characterization of thin films and multilayers of biological interest. The instrument is capable of measuring both specular and nonspecular reflectivity, as well as crystalline or semicrystalline diffraction at wave-vector transfers up to approximately 2.20 Å(-1). A detailed description of this flexible instrument and its performance characteristics in various operating modes are given.
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Review of Scientific Instruments
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