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Oblique incidence ellipsometric characterization and the substrate dependence of visible frequency fishnet metamaterials

dc.contributor.authorOates, T W H
dc.contributor.authorDastmalchi, B
dc.contributor.authorIsic, G
dc.contributor.authorTollabimazraehno, S
dc.contributor.authorHelgert, Christian
dc.contributor.authorPertsch, Thomas
dc.contributor.authorKley, E.-B.
dc.contributor.authorVerschuuren, M A
dc.contributor.authorBergmair, I
dc.contributor.authorHingerl, K
dc.contributor.authorHinrichs, K
dc.date.accessioned2015-12-13T22:19:34Z
dc.date.issued2012
dc.date.updated2016-02-24T09:04:03Z
dc.description.abstractWe use spectroscopic ellipsometry to investigate the angular-dependent optical modes of fishnet metamaterials fabricated by nanoimprint lithography. Spectroscopic ellipsometry is demonstrated as a fast and efficient method for metamaterial characterization and the measured polarization ratios significantly simplify the calibration procedures compared to reflectance and transmittance measurements. We show that the modes can be well identified by a combination of comparing different substrates and considering the angular dependence of the Wood's anomalies. The lack of angular dispersion of the anti-symmetric gap-modes does not agree with the model and requires further theoretical investigation.
dc.identifier.issn1094-4087
dc.identifier.urihttp://hdl.handle.net/1885/71874
dc.publisherOptical Society of America
dc.sourceOptics Express
dc.subjectKeywords: Angular dependence; Angular dispersions; Anti-symmetric; Calibration procedure; Different substrates; Oblique incidence; Optical modes; Polarization ratios; Theoretical investigations; Transmittance measurements; Visible frequencies; Wood's anomalies; Nan
dc.titleOblique incidence ellipsometric characterization and the substrate dependence of visible frequency fishnet metamaterials
dc.typeJournal article
local.bibliographicCitation.issue10
local.bibliographicCitation.lastpage11177
local.bibliographicCitation.startpage11166
local.contributor.affiliationOates, T W H, Leibniz - Institut für Analytische Wissenschaften
local.contributor.affiliationDastmalchi, B, Johannes Kepler University
local.contributor.affiliationIsic, G, University of Belgrade
local.contributor.affiliationTollabimazraehno, S, Johannes Kepler University
local.contributor.affiliationHelgert, Christian, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationPertsch, Thomas, Friedrich Schiller University
local.contributor.affiliationKley, E.-B., Friedrich-Schiller-Universität Jena
local.contributor.affiliationVerschuuren, M A , Philips Corporate Technologies
local.contributor.affiliationBergmair, I, PROFACTOR GmbH
local.contributor.affiliationHingerl, K, Johannes Kepler University
local.contributor.affiliationHinrichs, K, Leibniz - Institut für Analytische Wissenschaften
local.contributor.authoruidHelgert, Christian, u5155635
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.identifier.absfor020501 - Classical and Physical Optics
local.identifier.ariespublicationf5625xPUB2927
local.identifier.citationvolume20
local.identifier.scopusID2-s2.0-84861134244
local.identifier.thomsonID000298844300017
local.type.statusPublished Version

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