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Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances

dc.contributor.authorGlover, Christopher
dc.contributor.authorSchmitt, T
dc.contributor.authorMattesini, Maurizio
dc.contributor.authorAdell, M
dc.contributor.authorIlver, L
dc.contributor.authorKanski, J
dc.contributor.authorKjeldgaard, L
dc.contributor.authorAgaker, Marcus
dc.contributor.authorMartensson, N
dc.contributor.authorAhuja, Rajeev
dc.contributor.authorNordgren, J
dc.contributor.authorRubensson, Jan-Erik
dc.date.accessioned2015-12-10T21:56:34Z
dc.date.issued2009
dc.date.updated2016-02-24T10:55:23Z
dc.description.abstractResonant inelastic soft X-ray scattering at the 3p resonances in crystalline Ge is presented. Both stationary and dispersive features are observed in a wide energy range above as well as below the ionization limits. These observations are in agreement with theoretical predictions based on a two-step model where the initially excited electron has no influence on the emission step. Excess population of states in the conduction band is found, and discussed in terms of attosecond electron dynamics.
dc.identifier.issn0368-2048
dc.identifier.urihttp://hdl.handle.net/1885/39495
dc.publisherElsevier
dc.sourceJournal of Electron Spectroscopy and Related Phenomena
dc.subjectKeywords: Attosecond; Crystalline Ge; Electron dynamics; Excited electrons; Ionization limit; Resonant inelastic soft X-ray scattering; Semiconductors; Soft X-ray scattering (RIXS); Theoretical prediction; TWo-step model; Ultrafast dynamics; Wide energy range; Dyna Semiconductors; Soft X-ray scattering (RIXS); Spectroscopy; Synchrotron radiation; Ultrafast dynamics
dc.titleStationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances
dc.typeJournal article
local.bibliographicCitation.issue2-3
local.bibliographicCitation.lastpage107
local.bibliographicCitation.startpage103
local.contributor.affiliationGlover, Christopher, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationSchmitt, T, Paul Scherrer Institut
local.contributor.affiliationMattesini, Maurizio, Uppsala University
local.contributor.affiliationAdell, M, Chalmers University of Technology
local.contributor.affiliationIlver, L, Chalmers University of Technology
local.contributor.affiliationKanski, J, Chalmers University of Technology
local.contributor.affiliationKjeldgaard, L, Lund University
local.contributor.affiliationAgaker, Marcus, Uppsala University
local.contributor.affiliationMartensson, N, Uppsala University
local.contributor.affiliationAhuja, Rajeev, Uppsala University
local.contributor.affiliationNordgren, J, Uppsala University
local.contributor.affiliationRubensson, Jan-Erik, Uppsala University
local.contributor.authoruidGlover, Christopher, u3915129
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.identifier.absfor020499 - Condensed Matter Physics not elsewhere classified
local.identifier.ariespublicationu4326120xPUB178
local.identifier.citationvolume173
local.identifier.doi10.1016/j.elspec.2009.05.017
local.identifier.scopusID2-s2.0-67749115953
local.type.statusPublished Version

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