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SAXS analysis of embedded Pt nanocrystals irradiated with swift heavy Ions

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dc.contributor.authorGiulian, R.
dc.contributor.authorKluth, P.
dc.contributor.authorSprouster, D. J.
dc.contributor.authorAraujo, L. L.
dc.contributor.authorByrne, A. P.
dc.contributor.authorCookson, D. J.
dc.contributor.authorRidgway, M. C.
dc.date.accessioned2015-09-18T04:16:55Z
dc.date.available2015-09-18T04:16:55Z
dc.date.issued2009
dc.date.updated2016-02-24T08:44:12Z
dc.description.abstractElongated Pt nanocrystals (NCs) formed in SiO2 by ion implantation, thermal annealing and swift heavy ion irradiation were analyzed by small‐angle X‐ray scattering (SAXS) and transmission electron microscopy (TEM) measurements. Transmission SAXS measurements were performed in samples aligned at different angles relative to the photon beam resulting in non‐isotropic scattering and thus enabling the three dimensional analysis of the NCs. Selected angular sectors of the detector were integrated and analyzed separately, leading to the individual evaluation of both the major and minor dimensions of the rod‐shaped NCs. This method enables the use of well established spherical models for the SAXS data analysis and yielded excellent agreement with TEM results.
dc.identifier.issn0094-243Xen_AU
dc.identifier.urihttp://hdl.handle.net/1885/15564
dc.publisherAmerican Institute of Physics
dc.rightsCopyright (year) American Institute of Physics.
dc.sourceAIP Conference Proceedings
dc.subjectKeywords: Angle-dependent SAXS measurements; Elongated NCs; Swift heavy ion irradiation
dc.titleSAXS analysis of embedded Pt nanocrystals irradiated with swift heavy Ions
dc.typeJournal article
local.bibliographicCitation.lastpage47en_AU
local.bibliographicCitation.startpage45en_AU
local.contributor.affiliationGiulian, Raquel, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationKluth, Patrick, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationSprouster, David, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationAraujo, Leandro, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationByrne, Aidan, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Nuclear Physics, The Australian National Universityen_AU
local.contributor.affiliationCookson, D J, Australian Synchrotron Research Program, United States of Americaen_AU
local.contributor.affiliationRidgway, Mark C, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.authoruidU4174583en_AU
local.description.notesImported from ARIESen_AU
local.identifier.absfor020405en_AU
local.identifier.absfor100700en_AU
local.identifier.absfor100799en_AU
local.identifier.ariespublicationf5625xPUB13059en_AU
local.identifier.citationvolume1092en_AU
local.identifier.doi10.1063/1.3086232en_AU
local.identifier.scopusID2-s2.0-64849094106
local.publisher.urlhttps://www.aip.org/en_AU
local.type.statusPublished Versionen_AU

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