Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells

Date

2018

Authors

Ali, Haider
Bullock, James
Gregory, Geoffrey
Yang, Xinbo
Schneider, Matthew
Weber, Klaus
Javey, Ali
Davis, Kristopher

Journal Title

Journal ISSN

Volume Title

Publisher

IEEE

Abstract

The focus of this work is on the nano-scale characterization of transition metal oxides employed as carrier selective contacts in crystalline silicon (c-Si) solar cells using crosssectional transmission electron microscopy (TEM). Both electronselective (titanium dioxide, TiO2) and hole-selective (molybdenum oxide, MoOx; tungsten oxide, WOxtextbf) contacts were investigated. High-resolution TEM (HRTEM) images were obtained with a FEI Tecnai F30 TEM.

Description

Keywords

Citation

Source

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

Type

Conference paper

Book Title

Entity type

Access Statement

License Rights

DOI

10.1109/PVSC.2018.8547689

Restricted until

2037-12-31