Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells
Date
2018
Authors
Ali, Haider
Bullock, James
Gregory, Geoffrey
Yang, Xinbo
Schneider, Matthew
Weber, Klaus
Javey, Ali
Davis, Kristopher
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IEEE
Abstract
The focus of this work is on the nano-scale characterization of transition metal oxides employed as carrier selective contacts in crystalline silicon (c-Si) solar cells using crosssectional transmission electron microscopy (TEM). Both electronselective (titanium dioxide, TiO2) and hole-selective (molybdenum oxide, MoOx; tungsten oxide, WOxtextbf) contacts were investigated. High-resolution TEM (HRTEM) images were obtained with a FEI Tecnai F30 TEM.
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2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
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Conference paper
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2037-12-31
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