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Structural investigation on GexSb10Se90−x glasses using x-ray photoelectron spectra

dc.contributor.authorWei, Wen-Hou
dc.contributor.authorXiang, Shen
dc.contributor.authorXu, Si-Wei
dc.contributor.authorFang, Liang
dc.contributor.authorWang, Rong-Ping
dc.date.accessioned2015-10-23T00:36:58Z
dc.date.available2015-10-23T00:36:58Z
dc.date.issued2014-05-12
dc.date.updated2015-12-11T07:25:58Z
dc.description.abstractThe structure of GeₓSb₁₀Se₉₀ˍₓ glasses (x = 7.5, 10, 15, 20, 25, 27.5, 30, and 32.5 at. %) has been investigated by x-ray photoelectron spectroscopy (XPS). Different structural units have been extracted and characterized by decomposing XPS core level spectra, the evolution of the relative concentration of each structural unit indicates that, the relative contributions of Se-trimers and Se-Se-Ge(Sb) structure decrease with increasing Ge content until they become zero at chemically stoichiometric glasses of Ge₂₅Sb₁₀Se₆₅, and then the homopolar bonds like Ge-Ge and Sb-Sb begin to appear in the spectra. Increase of homopolar bonds will extend band-tails into the gap and narrow the optical band gap. Thus, the glass with a stoichiometric composition generally has fewer defective bonds and larger optical bandgap.
dc.identifier.issn0021-8979en_AU
dc.identifier.urihttp://hdl.handle.net/1885/16043
dc.publisherAmerican Institute of Physics (AIP)
dc.relationhttp://purl.org/au-research/grants/arc/CE110001018
dc.relationhttp://purl.org/au-research/grants/arc/DP110102753
dc.rightshttp://www.sherpa.ac.uk/romeo/issn/0021-8979..."Publishers version/PDF may be used on author's personal website, institutional website or institutional repository" from SHERPA/RoMEO site (as at 23/10/15). Copyright 2014 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics and may be found at https://doi.org/10.1063/1.4876258
dc.sourceJournal of Applied Physics
dc.titleStructural investigation on GexSb10Se90−x glasses using x-ray photoelectron spectra
dc.typeJournal article
local.bibliographicCitation.issue18en_AU
local.bibliographicCitation.lastpage4
local.bibliographicCitation.startpage183506en_AU
local.contributor.affiliationWei, W, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Laser Physics Centre, The Australian National Universityen_AU
local.contributor.affiliationXiang, Shen, Ningbo University, Chinaen_AU
local.contributor.affiliationXu, Si-Wei, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Laser Physics Centre, The Australian National Universityen_AU
local.contributor.affiliationFang, Liang, Chongqing University, Chinaen_AU
local.contributor.affiliationWang, Rongping, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Laser Physics Centre, The Australian National Universityen_AU
local.contributor.authoruidu4219061en_AU
local.description.notesImported from ARIESen_AU
local.identifier.absfor020500en_AU
local.identifier.absseo970102en_AU
local.identifier.ariespublicationU3488905xPUB2441en_AU
local.identifier.citationvolume115en_AU
local.identifier.doi10.1063/1.4876258en_AU
local.identifier.scopusID2-s2.0-84901506989
local.identifier.thomsonID000336919400010
local.publisher.urlhttps://www.aip.org/en_AU
local.type.statusPublished Versionen_AU

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