The Direct Measurement of Spectral Momentum Densities of Silicon with High Energy (e,2e) Spectroscopy

Abstract

Electron momentum spectroscopy is a coincidence technique that measures the spectral momentum density of matter. In this paper we outline the theoretical framework underlying these measurements, give a description of the spectrometer, and show in detail the information this technique can provide for the prototypical material silicon. We present results for single crystals as well as amorphous samples, describe the influence that diffraction and inelastic multiple scattering have on these measurements. The results are compared with full-potential linear-muffin-tin-orbital (FP-LMTO) calculations (for dispersion), and many-body calculations (for line shapes). Show more