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GeOᵪ and SiOᵪ nanowires grown via the active oxidation of Ge and Si substrates

dc.contributor.authorShalav, Avi
dc.contributor.authorCollin, Gabriel
dc.contributor.authorYang, Yi
dc.contributor.authorKim, Taehyun
dc.contributor.authorElliman, Robert G.
dc.date.accessioned2016-04-19T00:25:44Z
dc.date.available2016-04-19T00:25:44Z
dc.date.issued2011-07-12
dc.date.updated2016-06-14T09:05:48Z
dc.description.abstractIn this study, we show that the volatile monoxide species generated during the active oxidation of Ge and Si substrates can be utilized in the presence of Au catalytic nanoparticles to nucleate and grow GeOx and SiOx nanowires. A simple thermodynamic model is developed to ascertain the critical O2 partial pressure as a function of temperature required for the active oxidation of Ge and Si substrates and is experimentally verified. The ideal conditions for uniform nanowire growth across the substrate are shown to be primarily dependent on the O2 partial pressure, the annealing temperature and thicknesses of the surface oxide, and deposited Au. The role of a metastable surface oxide separating the active oxidation and NW nucleation processes is also discussed.
dc.description.sponsorshipThe Australian Research Council is gratefully acknowledged for financial support.en_AU
dc.identifier.issn0884-2914en_AU
dc.identifier.urihttp://hdl.handle.net/1885/101056
dc.publisherCambridge University Press
dc.rights© Materials Research Society 2011
dc.sourceJournal of Materials Research
dc.subjectNanostructure
dc.subjectSi
dc.subjectGe
dc.titleGeOᵪ and SiOᵪ nanowires grown via the active oxidation of Ge and Si substrates
dc.typeJournal article
local.bibliographicCitation.issue17en_AU
local.bibliographicCitation.lastpage2246en_AU
local.bibliographicCitation.startpage2240en_AU
local.contributor.affiliationShalav, Avi, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationCollin, Gabriel, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationYang, Yi, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationKim, Tae-Hyun, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.affiliationElliman, Robert, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National Universityen_AU
local.contributor.authoruidu9012877en_AU
local.description.notesImported from ARIESen_AU
local.identifier.absfor100708en_AU
local.identifier.absfor100712en_AU
local.identifier.ariespublicationu4479768xPUB28en_AU
local.identifier.citationvolume26en_AU
local.identifier.doi10.1557/jmr.2011.150en_AU
local.identifier.scopusID2-s2.0-84856862068
local.identifier.thomsonID000296083100013
local.publisher.urlhttp://www.cambridge.org/en_AU
local.type.statusPublished Versionen_AU

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