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Phase-stepping interferometry of GaAs nanowires: determining nano-wire radius

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Date

2013-10-15

Authors

Little, D. J.
Kuruwita, R. L.
Joyce, A.
Gao, Q.
Burgess, Timothy
Jagadish, C.
Kane, D. M.

Journal Title

Journal ISSN

Volume Title

Publisher

American Institute of Physics

Abstract

Phase stepping interferometry is used to measure the size of near-cylindrical nanowires. Nanowires with nominal radii of 25 nm and 50 nm were used to test this by comparing specific measured optical phase profile values with theoretical values calculated using a wave-optic model of the Phase stepping interferometry (PSI) system. Agreement within 10% was found, which enabled nanowire radii to be predicted within 4% of the nominal value. This demonstration highlights the potential capability for phase stepping interferometry to characterize single nanoparticles of known geometry in the optical far-field.

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Citation

URI

http://hdl.handle.net/1885/15654

Collections

ANU Research Publications

Source

Applied Physics Letters

Type

Journal article

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DOI

10.1063/1.4825153

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