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Force Microscopy and surface interactions

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dc.contributor.authorSenden, Timothy
dc.date.accessioned2015-12-10T23:34:35Z
dc.date.issued2001
dc.date.updated2015-12-10T11:34:33Z
dc.description.abstractThe force microscope provides the most flexible of surface force measurement techniques for probing the richness and complexity of surface interactions. The technique is reviewed over the past 3 years for developments in instrumentation, colloidal force measurement, and nano-mechanical measurements on single molecules.
dc.identifier.issn1359-0294
dc.identifier.urihttp://hdl.handle.net/1885/69490
dc.publisherPergamon-Elsevier Ltd
dc.sourceCurrent Opinion in Colloid and Interface Science
dc.subjectKeywords: atomic force microscopy; colloid; force; instrumentation; mechanical stimulation; molecular interaction; osmotic pressure; review; surface charge; surface property; thermal stimulation Atomic force microscopy; Cantilever; Colloids; Force spectroscopy; Single molecule elongation; Surface force measurement; Thermal noise; Tip-sample interactions
dc.titleForce Microscopy and surface interactions
dc.typeJournal article
local.bibliographicCitation.lastpage101
local.bibliographicCitation.startpage95
local.contributor.affiliationSenden, Timothy , College of Physical and Mathematical Sciences, ANU
local.contributor.authoruidSenden, Timothy , u8612475
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor020204 - Plasma Physics; Fusion Plasmas; Electrical Discharges
local.identifier.ariespublicationMigratedxPub2038
local.identifier.citationvolume6
local.identifier.doi10.1016/S1359-0294(01)00067-X
local.identifier.scopusID2-s2.0-0035014203
local.type.statusPublished Version

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