Force Microscopy and surface interactions
dc.contributor.author | Senden, Timothy | |
dc.date.accessioned | 2015-12-10T23:34:35Z | |
dc.date.issued | 2001 | |
dc.date.updated | 2015-12-10T11:34:33Z | |
dc.description.abstract | The force microscope provides the most flexible of surface force measurement techniques for probing the richness and complexity of surface interactions. The technique is reviewed over the past 3 years for developments in instrumentation, colloidal force measurement, and nano-mechanical measurements on single molecules. | |
dc.identifier.issn | 1359-0294 | |
dc.identifier.uri | http://hdl.handle.net/1885/69490 | |
dc.publisher | Pergamon-Elsevier Ltd | |
dc.source | Current Opinion in Colloid and Interface Science | |
dc.subject | Keywords: atomic force microscopy; colloid; force; instrumentation; mechanical stimulation; molecular interaction; osmotic pressure; review; surface charge; surface property; thermal stimulation Atomic force microscopy; Cantilever; Colloids; Force spectroscopy; Single molecule elongation; Surface force measurement; Thermal noise; Tip-sample interactions | |
dc.title | Force Microscopy and surface interactions | |
dc.type | Journal article | |
local.bibliographicCitation.lastpage | 101 | |
local.bibliographicCitation.startpage | 95 | |
local.contributor.affiliation | Senden, Timothy , College of Physical and Mathematical Sciences, ANU | |
local.contributor.authoremail | u8612475@anu.edu.au | |
local.contributor.authoruid | Senden, Timothy , u8612475 | |
local.description.embargo | 2037-12-31 | |
local.description.notes | Imported from ARIES | |
local.description.refereed | Yes | |
local.identifier.absfor | 020204 - Plasma Physics; Fusion Plasmas; Electrical Discharges | |
local.identifier.ariespublication | MigratedxPub2038 | |
local.identifier.citationvolume | 6 | |
local.identifier.doi | 10.1016/S1359-0294(01)00067-X | |
local.identifier.scopusID | 2-s2.0-0035014203 | |
local.identifier.uidSubmittedBy | Migrated | |
local.type.status | Published Version |
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