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Structural Characterization of Cu Nanocrystals Formed in SiO 2 by High-Energy Ion-Beam Synthesis

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Date

2005

Authors

Johannessen, Bernt
Kluth, Patrick
Glover, Christopher
de Azevedo, Gustavo
Llewellyn, David
Foran, Garry J
Ridgway, Mark C

Journal Title

Journal ISSN

Volume Title

Publisher

American Institute of Physics (AIP)

Abstract

Cu nanocrystals (NCs) were produced by multiple high-energy ion implantations into 5-μm -thick amorphous silica (Si O2) at liquid-nitrogen temperature. The Cu-rich Si O2 films were subsequently annealed to reduce irradiation-induced damage and promote NC

Description

Keywords

Keywords: Copper atoms; Structural disorder; X ray absorption fine structure spectroscopy; Amorphous materials; Backscattering; Electron microscopy; Ion beams; Ion implantation; Nanostructured materials; Oxidation; Rutherford backscattering spectroscopy; Silica; Sp

Citation

URI

http://hdl.handle.net/1885/80046

Collections

ANU Research Publications

Source

Journal of Applied Physics

Type

Journal article

Book Title

Entity type

Access Statement

License Rights

DOI

10.1063/1.1980533

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