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Potential of phase-diversity for metrology of active instruments

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dc.contributor.authorKorkiakoski, Visa
dc.contributor.authorVenema, Lars
dc.contributor.authorAgócs, Tibor
dc.contributor.authorKeller, Christoph U
dc.contributor.authorDoelman, Niek
dc.contributor.authorFraanje, Rufus
dc.contributor.authorAndrei, Raluca M
dc.contributor.authorVerhaegen, Michel
dc.coverage.spatialAmsterdam, Netherlands
dc.date.accessioned2018-11-30T01:19:52Z
dc.date.available2018-11-30T01:19:52Z
dc.date.createdJuly 1-6 2012
dc.date.issued2012
dc.date.updated2018-11-29T08:22:49Z
dc.description.abstractWe investigate the potential of phase-diversity (PD) and Gerchberg-Saxton (GS) algorithms in the calibration of active instruments. A set of images is recorded with the focal-plane scientific camera, each image having a known and unique defocus. The phase-retrieval algorithms are used, with those images, to estimate the non-common path aberration that needs to be compensated by correct alignment of the instrument. We demonstrate by numerical simulations that such algorithms, in particular GS, are sufficient detection methods to fully correct wavefronts with an rms error at least up to 6 rad - but this requires several iterative correction stages.
dc.format.mimetypeapplication/pdfen_AU
dc.identifier.isbn9780819491510
dc.identifier.urihttp://hdl.handle.net/1885/154220
dc.publisherSPIE - The International Society for Optical Engineering
dc.relation.ispartofseriesModern Technologies in Space- and Ground-Based Telescopes and Instrumentation II
dc.sourceProceedings of SPIE - The International Society for Optical Engineering
dc.titlePotential of phase-diversity for metrology of active instruments
dc.typeConference paper
dcterms.accessRightsOpen Accessen_AU
local.contributor.affiliationKorkiakoski, Visa, College of Science, ANU
local.contributor.affiliationVenema, Lars, ASTRON
local.contributor.affiliationAgócs, Tibor, NOVA Optical Infrared Instrumentation Group at ASTRON
local.contributor.affiliationKeller, Christoph U, Leiden University
local.contributor.affiliationDoelman, Niek, TNO Science and Industry
local.contributor.affiliationFraanje, Rufus, Delft Center for Systems and Control
local.contributor.affiliationAndrei, Raluca M, Delft Center for Systems and Control
local.contributor.affiliationVerhaegen, Michel, Delft Center for Systems and Control
local.contributor.authoruidKorkiakoski, Visa, u1025408
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor099999 - Engineering not elsewhere classified
local.identifier.ariespublicationu6048437xPUB306
local.identifier.doi10.1117/12.926290
local.identifier.scopusID2-s2.0-84872240995
local.type.statusPublished Version

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