Low loss and dispersion engineered ZnSe waveguides at telecom wavelengths
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Fang, Yiming
Yang, Zhen
Li, Chengdong
Xu, Peipeng
Yan, Kunlun
Sheng, Yan
Tao, Haizheng
Wang, Rongping
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American Institute of Physics (AIP)
Abstract
We have successfully fabricated a dispersion engineered ZnSe waveguide. The ZnSe film was deposited on a CaF2 substrate by radio frequency magnetron sputtering, and the waveguide was patterned directly on the ZnSe films by UV lithography and inductively coupled plasma etching. The nonlinear coefficient in the 4-μm-width waveguide was calculated to be 0.73 w−1 m−1 for both TE and TM modes at 1.55 µm. The loss of the ZnSe rib waveguides was measured to be 4.3 dB/cm at 1550 nm using the cut-back method.
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AIP Advances
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