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Nonlinear absorption and refraction in crystalline silicon in the mid-infrared

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Date

2013

Authors

Gai, Xin
Yu, Yi
Kuyken, Bart
Ma, Pan
Madden, Steve
Campenhout, Joris Van
Verheyen, Peter
Roelkens, Gunther
Baets, Roel
Luther-Davies, Barry

Journal Title

Journal ISSN

Volume Title

Publisher

Wiley-VCH Verlag GMBH

Abstract

The wavelength dependence of the nonlinear absorption and the third order nonlinear refraction of crystalline silicon between 2.75μm and 5.5μm as well as at 1.55μm have been measured. It was found that at all wavelengths multi-photon and free carrier a

Description

Keywords

Citation

URI

http://hdl.handle.net/1885/18084

Collections

ANU Research Publications

Source

Laser and Photonics Reviews

Type

Journal article

Book Title

Entity type

Access Statement

License Rights

DOI

10.1002/lpor.201300103

Restricted until

2037-12-31

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01_Gai_Nonlinear_absorption_and_2013.pdf (688.37 KB)

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