Optical and structural properties of Ge-Sb-Se thin films fabricated by sputtering and thermal evaporation
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Chen, Yu
Shen, Xiang
Wang, Rongping
Wang, Guoxiang
Dai, Shixun
Xu, Tiefeng
Nie, Qiuhua
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Elsevier
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We deposited Ge28Sb12Se60 chalcogenide films using either thermal evaporation or radio-frequency magnetron sputtering techniques, and then measured their structural and optical properties using various diagnosis tools. The refractive indices of the films
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Journal of Alloys and Compounds
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2037-12-31
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