Optical and structural properties of Ge-Sb-Se thin films fabricated by sputtering and thermal evaporation

Loading...
Thumbnail Image

Date

Authors

Chen, Yu
Shen, Xiang
Wang, Rongping
Wang, Guoxiang
Dai, Shixun
Xu, Tiefeng
Nie, Qiuhua

Journal Title

Journal ISSN

Volume Title

Publisher

Elsevier

Abstract

We deposited Ge28Sb12Se60 chalcogenide films using either thermal evaporation or radio-frequency magnetron sputtering techniques, and then measured their structural and optical properties using various diagnosis tools. The refractive indices of the films

Description

Citation

Source

Journal of Alloys and Compounds

Book Title

Entity type

Access Statement

License Rights

Restricted until

2037-12-31