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Strengthening brittle semiconductor nanowires through stacking faults: Insights from in situ mechanical testing

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Date

2013

Authors

Chen, Bin
Wang, Jun
Gao, Qiang
Chen, Yujie
Liao, Xiao-Zhou
Lu, Chunsheng
Mai, Yiu-Wing
Zou, Jin
Ringer, Simon P.
Gao, Hua-Jian

Journal Title

Journal ISSN

Volume Title

Publisher

American Chemical Society

Abstract

Quantitative mechanical testing of single-crystal GaAs nanowires was conducted using in situ deformation transmission electron microscopy. Both zinc-blende and wurtzite structured GaAs nanowires showed essentially elastic deformation until bending failure

Description

Keywords

Keywords: Defect engineering; Gaas nanowires; Molecular dynamics simulations; Semiconductor nanowire; Situ deformation; Wurtzite nanowires; Wurtzites; Zinc-blende; Buckling; Compressive stress; Deformation; Gallium arsenide; Mechanical testing; Molecular dynamics; GaAs nanowires; in situ deformation; molecular dynamics; stacking fault; strengthening; transmission electron microscopy

Citation

URI

http://hdl.handle.net/1885/74822

Collections

ANU Research Publications

Source

Nano Letters

Type

Journal article

Book Title

Entity type

Access Statement

License Rights

DOI

10.1021/nl402180k

Restricted until

2037-12-31

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Description
01_Chen_Strengthening_brittle_2013.pdf (3.07 MB)

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