Formation of N719 dye multilayers on dye sensitized solar cell photoelectrode surfaces investigated by direct determination of element concentration depth profiles

dc.contributor.authorEllis-Gibbings, Lilian
dc.contributor.authorJohansson, Viktor
dc.contributor.authorWalsh, Rick
dc.contributor.authorKloo, Lars
dc.contributor.authorQuinton, Jamie S
dc.contributor.authorAndersson, Gunther
dc.date.accessioned2015-12-10T23:06:51Z
dc.date.issued2012
dc.date.updated2016-02-24T09:34:46Z
dc.description.abstractThe structure of the dye layer adsorbed on the titania substrate in a dye-sensitized solar cell is of fundamental importance for the function of the cell, since it strongly influences the injection of photoelectrons from the excited dye molecules into the titania substrate. The adsorption isotherms of the N719 ruthenium-based dye were determined both with a direct method using the depth profiling technique neutral impact collision ion scattering spectroscopy (NICISS) and with the standard indirect solution depletion method. It is found that the dye layer adsorbed on the titania surface is laterally inhomogeneous in thickness and there is a growth mechanism already from low coverage levels involving a combination of monolayers and multilayers. It is also found that the amount of N719 adsorbed on the substrate depends on the titania structure. The present results show that dye molecules in dye-sensitized solar cells are not necessarily, as presumed, adsorbed as a self-assembled monolayer on the substrate.
dc.identifier.issn0743-7463
dc.identifier.urihttp://hdl.handle.net/1885/62837
dc.publisherAmerican Chemical Society
dc.sourceLangmuir
dc.subjectKeywords: Direct determination; Direct method; Dye layers; Dye molecule; Dye-Sensitized solar cell; Element concentrations; Growth mechanisms; N719 dye; Neutral impact collision; Photoelectrode; Titania; Titania surfaces; Molecules; Photoelectrochemical cells; Ruth
dc.titleFormation of N719 dye multilayers on dye sensitized solar cell photoelectrode surfaces investigated by direct determination of element concentration depth profiles
dc.typeJournal article
local.bibliographicCitation.issue25
local.bibliographicCitation.lastpage9439
local.bibliographicCitation.startpage9431
local.contributor.affiliationEllis-Gibbings, Lilian, Flinders University
local.contributor.affiliationJohansson, Viktor, KTH Royal Institute of Technology
local.contributor.affiliationWalsh, Rick, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationKloo, Lars, Royal Institute of Technology, Stockholm
local.contributor.affiliationQuinton, Jamie S, Flinders University
local.contributor.affiliationAndersson, Gunther, Flinders University
local.contributor.authoruidWalsh, Rick, u4139008
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.identifier.absfor020405 - Soft Condensed Matter
local.identifier.ariespublicationf5625xPUB742
local.identifier.citationvolume28
local.identifier.doi10.1021/la300077g
local.identifier.scopusID2-s2.0-84862850318
local.identifier.thomsonID000305661400032
local.type.statusPublished Version

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