High precision SIMS oxygen isotope analysis and the effect of sample topography
Date
2009
Authors
Kita, Noriko T
Ushikubo, Takayuki
Fu, Bin
Valley, John
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Publisher
Elsevier
Abstract
We have developed highly precise and accurate in situ SIMS stable isotope analytical protocols using the IMS-1280 at the University of Wisconsin, through careful tuning of the instrument, stable electronics, and improved protocols for sample preparation,
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Keywords
Keywords: isotopic analysis; isotopic ratio; mass spectrometry; oxygen; stable isotope; topography; North America; United States; Wisconsin High precision; Instrumental bias; Isotope ratios; Oxygen; Secondary ion mass spectrometer
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Source
Chemical Geology
Type
Journal article
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2037-12-31
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