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High precision SIMS oxygen isotope analysis and the effect of sample topography

Date

Authors

Kita, Noriko T

Ushikubo, Takayuki

Fu, Bin

Valley, John

Publisher

Elsevier

Abstract

We have developed highly precise and accurate in situ SIMS stable isotope analytical protocols using the IMS-1280 at the University of Wisconsin, through careful tuning of the instrument, stable electronics, and improved protocols for sample preparation,

Keywords

Keywords: isotopic analysis; isotopic ratio; mass spectrometry; oxygen; stable isotope; topography; North America; United States; Wisconsin High precision; Instrumental bias; Isotope ratios; Oxygen; Secondary ion mass spectrometer

URI

http://hdl.handle.net/1885/79952

Collections

ANU Research Publications

Source

Chemical Geology

Type

Journal article

DOI

10.1016/j.chemgeo.2009.02.012

Restricted until

2037-12-31

Downloads

File

Description

01_Kita_High_precision_SIMS_oxygen_2009.pdf (1.38 MB)